Control techniques for increasing the scan speed and minimizing image artifacts in tapping-mode atomic force microscopy: toward video-rate nanoscale imaging

Title: Control techniques for increasing the scan speed and minimizing image artifacts in tapping-mode atomic force microscopy: toward video-rate nanoscale imaging
Creator: Fairbairn, Matthew W.; Moheimani, S.O. Reza
Relation: IEEE Control Systems Magazine Vol. 33, Issue 6, p. 46-67
Publisher Link: http://dx.doi.org/10.1109/MCS.2013.2279471
Publisher: Institute of Electrical and Electronics Engineers
Resource Type: journal article
Date: 2013
Description: The atomic force microscope (AFM) [1] is a mechanical microscope capable of producing three-dimensional images of a wide variety of sample surfaces with nanometer precision in air, vacuum, or liquid environments. This article provides an overview of the AFM and its three main modes of operation, with a focus on the tapping mode of operation. The challenges associated with obtaining high-speed images with a tapping-mode AFM while minimizing image artifacts are outlined and control techniques that have been developed to overcome these challenges are reviewed.
Subject: atomic force microscope; microscope; three-dimensional images; high-speed images
Identifier: http://hdl.handle.net/1959.13/1341288
Identifier: uon:28704
Identifier: ISSN:1066-033X
Language: eng
Reviewed

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